|
Shikino High-Tech and Socionext Prototype Communication Module Compliant with HD-PLC Fourth-Generation Standard IEEE1901-2020
Shikino High-Tech Co., Ltd. and Socionext Inc. today announced that the companies have developed a prototype communication module, the P-TMFSU-041, and confirmed its operation.
Read more
Socionext, Techsor and ZiFiSense Unveil IC for “ZETag®”, a New Cloud Tag to Utilize ZETA Communication
Socionext Inc., ZiFiSense and Techsor announced today that the companies have jointly developed a new IC "SC1330", designed for ZETag, a next generation Cloud Tag that utilizes ZETA communication protocol. Read more
Socionext and Tohoku University Significantly Accelerate Deep Learning-based SLAM Processing
Socionext Inc. has collaborated with a research group from Tohoku University, led by Professor Takayuki Okatani, and developed a new method that can reduce processing time required for SLAM (Simultaneous Localization and Mapping), which is essential for devices that perform autonomous control, down to 1/60 of the time needed by conventional technologies. Read more
Socionext Wins 2021 ‘Best of Sensors’ Award from Questex Sensors Converge
The SC123x series RF CMOS Sensors from Socionext has won the 2021 ‘Best of Sensors’ Award in the Embedded Category, made by Questex’s Sensors Converge, organizers of the annual Sensors Expo and Conference. Read more
CAST IP Helps Socionext Develop Advanced Autonomous Driving Systems
IP cores and related support services from intellectual property provider CAST Inc. have significantly facilitated the development of advanced automobile driving solutions by leading Systems-on-Chip provider Socionext Inc. Read more
Socionext and Partners Clarify Differences between Semiconductor Soft Errors Caused by Cosmic-Ray Muons and Neutrons
Socionext Inc. has collaborated with researchers from the Institute of Materials Structure Science at High Energy Accelerator Research Organization, Institute for Integrated Radiation and Nuclear Science at Kyoto University, and Graduate School of Information Science and Technology at Osaka University, and has successfully demonstrated, for the first time, that the soft errors of semiconductor devices induced by muons and neutrons have different characteristics. Read more
|
